Improve string quality to optimize module efficiency
Photoluminescence (PL) inspection stimulates photon emission by illuminating cells with specific wavelengths, revealing critical information about material integrity and electrical properties. LUMI-Q String, ISRA VISION’s PL inspection system, seamlessly integrated into the stringer outlet, works without laser while guaranteeing comprehensive defect identification and classification.
LUMI-Q String solutions are powered by
- Detection of all electrical & material defects: Microcracks, soldering defects, insulated areas, scratches, stains, electrical cell mismatch
- Seamless integration without additional footprint (retrofit-ready)
- Laser free – no safety class
- No contacting: less additional parts (wear) and cell damage risk
- Detection of all geometrical defects: ribbon misalignment, ribbon kink/cell shifting, string properties/geometry
- Fab data management with central recipe management and comprehensive data reporting
- On-the-fly measurement
- Even for wafer sizes >210 mm